International Symposium on Quality Electronic Design (ISQED)

Diagnosis of small delay defects arising due to manufacturing imperfections using path delay measurements

Pub Date : 2013-03-04 DOI: 10.1109/ISQED.2013.6523655 Ahish Mysore Somashekar, S. Tragoudas

Stochastic behavioral modeling of analog/mixed-signal circuits by maximizing entropy

Pub Date : 2013-03-04 DOI: 10.1109/ISQED.2013.6523668 R. Krishnan, Wei Wu, Fang Gong, Lei He

A cost-effective 45nm 6T-SRAM reducing 50mV Vmin and 53% standby leakage with multi-Vt asymmetric halo MOS and write assist circuitry

Pub Date : 2013-03-04 DOI: 10.1109/ISQED.2013.6523648 K. Nii, M. Yabuuchi, H. Fujiwara, Y. Tsukamoto, Y. Ishii, T. Matsumura, Y. Matsuda