2023 IEEE International Reliability Physics Symposium (IRPS)

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2023 IEEE International Reliability Physics Symposium (IRPS) - 最新文献

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Comprehensive Analysis of Hole-Trapping in SiN Films with a Wide Range of Time Constants Based on Dynamic C-V

Pub Date : 2023-03-01 DOI: 10.1109/IRPS48203.2023.10118083 Harumi Seki, R. Ichihara, Y. Higashi, Y. Nakasaki, M. Saitoh, Masamichi Suzuki

High Temperature and High Humidity Reliability Evaluation of Large-Area 1200V and 1700V SiC Diodes

Pub Date : 2023-03-01 DOI: 10.1109/IRPS48203.2023.10118095 I. Ji, A. Mathew, Jae-Hyung Park, Neal Oldham, Matthew McCain, S. Sabri, E. Brunt, B. Hull, D. Lichtenwalner, D. Gajewski, J. Palmour

Performing Machine Learning Based Outlier Detection for Automotive Grade Products

Pub Date : 2023-03-01 DOI: 10.1109/IRPS48203.2023.10118207 Y. L. Yang, P. Tsao, C. W. Lin, Ross Lee, Olivia Ni, T. T. Chen, Y. Ting, C. Lai, Jason Yeh, Arnold Yang, Wayne Huang, Peng Chen, Charly Tsai, Ryan Yang, Y. S. Huang, B. Hsu, M. Z. Lee, T. Lee, Michael Huang, Coming Chen, L. Chu, H. Kao, N. S. Tsai

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