Proceedings of the 1997 6th International Symposium on the Physical and Failure Analysis of Integrated Circuits

Analysis of GaAs HBT failure mechanisms: impact on life test strategy

Pub Date : 1997-07-21 DOI: 10.1109/IPFA.1997.638194 C. Maneux, N. Labat, N. Saysset, A. Touboul, Y. Danto, J. Dumas, P. Launay, J. Dangla

Analysis and quantification of device spectral signatures observed using a spectroscopic photon emission microscope

Pub Date : 1997-07-21 DOI: 10.1109/IPFA.1997.638069 J. Tao, W. Chim, D.S.H. Chan, J. Phang, Y.Y. Liu

Functional failure analysis of logic LSIs from backside of the chip and its verification by logic simulation

Pub Date : 1997-07-21 DOI: 10.1109/IPFA.1997.638068 T. Ishii, M. Inoue, N. Asatani, K. Naitoh, J. Mitsuhashi