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Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics

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Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics

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Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics - 最新文献

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Application of the time domain current response method to the examination of dysprosium oxide capacitors

Pub Date : 1989-07-03 DOI: 10.1109/ICSD.1989.69189 T. Wiktorczyk, Z. Bober, K. Nitsch

The effect of included flaws upon the AC breakdown of polyethylene

Pub Date : 1989-07-03 DOI: 10.1109/ICSD.1989.69161 R. Coppard, J. Bowman, R. Rakowski, R.T. Durnham, S. Rowland
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