ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis

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ISTFA 2021: Conference Proceedings from the 47th International Symposium for Testing and Failure Analysis - 最新文献

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Accelerate Your 3D X-ray Failure Analysis by Deep Learning High Resolution Reconstruction

Pub Date : 2021-10-31 DOI: 10.31399/asm.cp.istfa2021p0291 A. Gu, A. Andreyev, M. Terada, Bernice Zee, Syahirah Mohammad-Zulkifli, Yanjing Yang

Scanning Acoustic Microscopy Package Fingerprint Extraction for Integrate Circuit Hardware Assurance

Pub Date : 2021-10-31 DOI: 10.31399/asm.cp.istfa2021p0059 Daniel Johnson, Po-Wei Hsu, Chengjie Xi, N. Asadizanjani

Low Angle Annular Dark Field Scanning Transmission Electron Microscopy Analysis of Phase Change Material

Pub Date : 2021-10-31 DOI: 10.31399/asm.cp.istfa2021p0206 J. Li, K. Brew, K. Cheng, V. Chan, N. Arnold, A. Gasasira, R. Pujari, J. Demarest, M. Iwatake, L. Tierney, O. Ogundipe, K. Toole, N. Li

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