The Japan Society of Applied Physics

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Effect of Mo, W Substitution on Ferroelectric Characteristics, Crystal and Electronic Structure of Bi0.5K0.5TiO3-BiFeO3-KTaO3 Based Ferroelectric Ceramics

Pub Date : 2020-01-28 DOI: 10.1149/ma2020-02683568mtgabs Tsuyoshi Kawamoto, N. Ishida, N. Kitamura, Y. Idemoto

Inductively Coupled Plasma Sputtering System for Oxide Semiconductors for a Large Area Deposition

Pub Date : 2020-01-28 DOI: 10.36463/IDW.2020.0331 S. Kishida, D. Matsuo, T. Ikeda, Y. Setoguchi, Y. Andoh

Fabrication of Recessed-Gate AlGaN/GaN Hemts Utilizing Contactless Photo-Electrochemical (CL-PEC) Etching

Pub Date : 2020-01-28 DOI: 10.1149/ma2020-02261818mtgabs M. Toguchi, K. Miwa, F. Horikiri, N. Fukuhara, Y. Narita, O. Ichikawa, R. Isono, Takeshi Tanaka, Taketomo Sato

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