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2015 International Workshop on CMOS Variability (VARI)

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2015 International Workshop on CMOS Variability (VARI)

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2015 International Workshop on CMOS Variability (VARI) - 最新文献

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Within-die and die-to-die variability on 65nm CMOS : oscillators experimental results

Pub Date : 2015-09-01 DOI: 10.1109/VARI.2015.7456559 Juan Pablo Martinez Brito, M. Lubaszewski, S. Bampi

Is intrinsic noise a limiting factor for subthreshold digital logic in nanoscale CMOS?

Pub Date : 2015-09-01 DOI: 10.1109/VARI.2015.7456562 Francisco Veirano, F. Silveira, Lirida Navinery

Study and reduction of variability in 28 nm FDSOI technology

Pub Date : 2015-09-01 DOI: 10.1109/VARI.2015.7456557 G. Jacquemod, Zhaopeng Wei, Jad Modad, Y. Leduc, P. Lorenzini, F. Hameau, E. de Foucauld
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