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2014 15th Latin American Test Workshop - LATW

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2014 15th Latin American Test Workshop - LATW

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2014 15th Latin American Test Workshop - LATW - 最新文献

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The effects of total ionizing dose on the neutron SEU cross section of a 130 nm 4 Mb SRAM memory

Pub Date : 2014-03-12 DOI: 10.1109/LATW.2014.6841919 E. C. F. Pereira, O. Gonçalez, R. G. Vaz, C. Federico, T. H. Both, G. Wirth

Methodology for achieving best trade-off of area and fault masking coverage in ATMR

Pub Date : 2014-03-12 DOI: 10.1109/LATW.2014.6841916 I. A. C. Gomes, Mayler G. A. Martins, F. Kastensmidt, A. Reis, R. Ribas, Sylvain P. Novales

Possibilities of defect-size magnification for testing resistive-opens in nanometer technologies

Pub Date : 2014-03-12 DOI: 10.1109/LATW.2014.6841909 J. L. Garcia-Gervacio, J. Martínez-Castillo, V. Champac
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