1995 53rd Annual Device Research Conference Digest

Improvement of porous silicon EL efficiency during anodic oxidation and the application of a new microstructure analysis method

Pub Date : 1995-06-19 DOI: 10.1109/DRC.1995.496301 T. Sakai, T. Suzuki, Li Zhang

Broadly-tunable, narrow-linewidth resonant cavity light emitter

Pub Date : 1995-06-19 DOI: 10.1109/DRC.1995.496299 M. Larson, J. Harris

A Monte Carlo study of drain and channel engineering effects on hot electron injection and induced device degradation in 0.1 /spl mu/m n-MOSFETs

Pub Date : 1995-06-19 DOI: 10.1109/DRC.1995.496229 R.B. Hulfachor, K.W. Kim, M. Littlejohn, C. Osburn