Electrical Overstress/Electrostatic Discharge Symposium Proceedings 2000 (IEEE Cat. No.00TH8476)

Device charging in shipping packages

Pub Date : 2000-09-26 DOI: 10.1109/EOSESD.2000.890103 B. Unger

Investigation on different ESD protection strategies devoted to 3.3 V RF applications (2 GHz) in a 0.18 /spl mu/m CMOS process

Pub Date : 2000-09-26 DOI: 10.1109/EOSESD.2000.890084 C. Richier, Pascal Salome, G. Mabboux, I. Zaza, A. Juge, P. Mortini

A method for determining a transmission line pulse shape that produces equivalent results to human body model testing methods

Pub Date : 2000-09-26 DOI: 10.1109/EOSESD.2000.890032 J.C. Lee, M. A. Hoque, G. Croft, J. Liou, W. R. Young, J. Bernier