2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

Using digital imagers to characterize the dependence of energy and area distributions of SEUs on elevation

Pub Date : 2020-10-19 DOI: 10.1109/DFT50435.2020.9250888 G. Chapman, Rohan Thomas, Klinsmann J. Coelho Silva Meneses, Ruoyi Zhao, I. Koren, Z. Koren

Reliability Evaluation of Pruned Neural Networks against Errors on Parameters

Pub Date : 2020-10-19 DOI: 10.1109/DFT50435.2020.9250812 Zhen Gao, Xiaohui Wei, Han Zhang, Wenshuo Li, Guangjun Ge, Yu Wang, P. Reviriego

Observability Driven Path Generation for Delay Test Coverage Improvement in Scan Limited Circuits

Pub Date : 2020-10-19 DOI: 10.1109/DFT50435.2020.9250797 Avijit Chakraborty, D. Walker