2016 International Conference on Microelectronic Test Structures (ICMTS)

Test structures to support the development and process verification of microelectrodes for high temperature operation in molten salts

Pub Date : 2016-05-23 DOI: 10.1109/ICMTS.2016.7476198 E. Blair, D. Corrigan, I. Schmueser, J. Terry, Stewart Smith, Andrew R. Mount, Anthony J. Walton

New power-gating architectures using nonvolatile retention: Comparative study of nonvolatile power-gating (NVPG) and normally-off architectures for SRAM

Pub Date : 2016-05-23 DOI: 10.1109/ICMTS.2016.7476193 Y. Shuto, Shuu'ichirou Yamamoto, S. Sugahara

Test structures of LASCR device for RF ESD protection in nanoscale CMOS process

Pub Date : 2016-05-20 DOI: 10.1109/ICMTS.2016.7476183 Chun-Yu Lin, Rong-Kun Chang