Electrical Atomic Force Microscopy for Nanoelectronics

Characterizing Ferroelectricity with an Atomic Force Microscopy: An All-Around Technique

Pub Date : 2019-08-01 DOI: 10.1007/978-3-030-15612-1_6 S. Martin, B. Gautier, N. Baboux, A. Gruverman, A. Carretero-Genevrier, M. Gich, A. Gómez

Electrical AFM for the Analysis of Resistive Switching

Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-15612-1_7 S. Brivio, J. Frascaroli, Min Hwan Lee

Conductive AFM for Nanoscale Analysis of High-k Dielectric Metal Oxides

Pub Date : 1900-01-01 DOI: 10.1007/978-3-030-15612-1_2 C. Rodenbücher, M. Wojtyniak, K. Szot