Pub Date : 2019-08-01DOI: 10.1007/978-3-030-15612-1_6
S. Martin, B. Gautier, N. Baboux, A. Gruverman, A. Carretero-Genevrier, M. Gich, A. Gómez
{"title":"Characterizing Ferroelectricity with an Atomic Force Microscopy: An All-Around Technique","authors":"S. Martin, B. Gautier, N. Baboux, A. Gruverman, A. Carretero-Genevrier, M. Gich, A. Gómez","doi":"10.1007/978-3-030-15612-1_6","DOIUrl":"https://doi.org/10.1007/978-3-030-15612-1_6","url":null,"abstract":"","PeriodicalId":377915,"journal":{"name":"Electrical Atomic Force Microscopy for Nanoelectronics","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2019-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127329123","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1007/978-3-030-15612-1_7
S. Brivio, J. Frascaroli, Min Hwan Lee
{"title":"Electrical AFM for the Analysis of Resistive Switching","authors":"S. Brivio, J. Frascaroli, Min Hwan Lee","doi":"10.1007/978-3-030-15612-1_7","DOIUrl":"https://doi.org/10.1007/978-3-030-15612-1_7","url":null,"abstract":"","PeriodicalId":377915,"journal":{"name":"Electrical Atomic Force Microscopy for Nanoelectronics","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127639240","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1007/978-3-030-15612-1_2
C. Rodenbücher, M. Wojtyniak, K. Szot
{"title":"Conductive AFM for Nanoscale Analysis of High-k Dielectric Metal Oxides","authors":"C. Rodenbücher, M. Wojtyniak, K. Szot","doi":"10.1007/978-3-030-15612-1_2","DOIUrl":"https://doi.org/10.1007/978-3-030-15612-1_2","url":null,"abstract":"","PeriodicalId":377915,"journal":{"name":"Electrical Atomic Force Microscopy for Nanoelectronics","volume":"92 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127058584","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1007/978-3-030-15612-1_9
C. Villeneuve-Faure, K. Makasheva, L. Boudou, G. Teyssèdre
{"title":"Space Charge at Nanoscale: Probing Injection and Dynamic Phenomena Under Dark/Light Configurations by Using KPFM and C-AFM","authors":"C. Villeneuve-Faure, K. Makasheva, L. Boudou, G. Teyssèdre","doi":"10.1007/978-3-030-15612-1_9","DOIUrl":"https://doi.org/10.1007/978-3-030-15612-1_9","url":null,"abstract":"","PeriodicalId":377915,"journal":{"name":"Electrical Atomic Force Microscopy for Nanoelectronics","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125194869","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1007/978-3-030-15612-1_4
J. Mody, J. Nxumalo
{"title":"Scanning Capacitance Microscopy for Two-Dimensional Carrier Profiling of Semiconductor Devices","authors":"J. Mody, J. Nxumalo","doi":"10.1007/978-3-030-15612-1_4","DOIUrl":"https://doi.org/10.1007/978-3-030-15612-1_4","url":null,"abstract":"","PeriodicalId":377915,"journal":{"name":"Electrical Atomic Force Microscopy for Nanoelectronics","volume":"243 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124683453","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1007/978-3-030-15612-1_1
U. Celano
{"title":"The Atomic Force Microscopy for Nanoelectronics","authors":"U. Celano","doi":"10.1007/978-3-030-15612-1_1","DOIUrl":"https://doi.org/10.1007/978-3-030-15612-1_1","url":null,"abstract":"","PeriodicalId":377915,"journal":{"name":"Electrical Atomic Force Microscopy for Nanoelectronics","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130195586","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1007/978-3-030-15612-1_11
T. Hantschel, T. Conard, J. Kilpatrick, G. Cross
{"title":"Diamond Probes Technology","authors":"T. Hantschel, T. Conard, J. Kilpatrick, G. Cross","doi":"10.1007/978-3-030-15612-1_11","DOIUrl":"https://doi.org/10.1007/978-3-030-15612-1_11","url":null,"abstract":"","PeriodicalId":377915,"journal":{"name":"Electrical Atomic Force Microscopy for Nanoelectronics","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131880905","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1007/978-3-030-15612-1_10
F. Giannazzo, G. Greco, F. Roccaforte, C. Mahata, M. Lanza
{"title":"Conductive AFM of 2D Materials and Heterostructures for Nanoelectronics","authors":"F. Giannazzo, G. Greco, F. Roccaforte, C. Mahata, M. Lanza","doi":"10.1007/978-3-030-15612-1_10","DOIUrl":"https://doi.org/10.1007/978-3-030-15612-1_10","url":null,"abstract":"","PeriodicalId":377915,"journal":{"name":"Electrical Atomic Force Microscopy for Nanoelectronics","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130450107","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1007/978-3-030-15612-1_8
A. Hirohata, M. Samiepour, M. Corbetta
{"title":"Magnetic Force Microscopy for Magnetic Recording and Devices","authors":"A. Hirohata, M. Samiepour, M. Corbetta","doi":"10.1007/978-3-030-15612-1_8","DOIUrl":"https://doi.org/10.1007/978-3-030-15612-1_8","url":null,"abstract":"","PeriodicalId":377915,"journal":{"name":"Electrical Atomic Force Microscopy for Nanoelectronics","volume":"101 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124852093","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1007/978-3-030-15612-1_3
A. Schulze, P. Eyben, J. Mody, K. Paredis, L. Wouters, U. Celano, W. Vandervorst
{"title":"Mapping Conductance and Carrier Distributions in Confined Three-Dimensional Transistor Structures","authors":"A. Schulze, P. Eyben, J. Mody, K. Paredis, L. Wouters, U. Celano, W. Vandervorst","doi":"10.1007/978-3-030-15612-1_3","DOIUrl":"https://doi.org/10.1007/978-3-030-15612-1_3","url":null,"abstract":"","PeriodicalId":377915,"journal":{"name":"Electrical Atomic Force Microscopy for Nanoelectronics","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130910483","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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