2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)

On measurement of reverberation chamber time constant and related curve fitting techniques

Pub Date : 2015-09-14 DOI: 10.1109/ISEMC.2015.7256196 Xiaotian Zhang, M. Robinson, I. Flintoft

Increased EMI immunity in CMOS operational amplifiers using an integrated common-mode cancellation circuit

Pub Date : 2015-09-14 DOI: 10.1109/ISEMC.2015.7256128 Marco Grassi, Jean-Michel Redouté, A. Richelli

A fuzzy approach for IEMI risk analysis of IT-Systems with respect to transient disturbances

Pub Date : 2015-09-14 DOI: 10.1109/ISEMC.2015.7256318 T. Peikert, H. Garbe, S. Potthast