Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256196
Xiaotian Zhang, M. Robinson, I. Flintoft
The reverberation chamber time constant quantifies how fast a reverberation chamber loses its stored energy at different frequencies, which makes it a very important parameter in many power related tests, such as the measurement of antenna efficiency, the measurement of absorption cross section, and the electromagnetic immunity test of electronic devices. The chamber time constant is usually obtained by doing regressions of power delay profile and calculating its gradient. But the shape of power delay profile can sometimes be distorted by the band limited window function applied in the frequency domain. A non-linear curve fitting technique which can cancel the effect of window function was developed, aiming to give a robust determination of the chamber time constant. With the help of this technique, window functions with much smaller bandwidth can be applied without introducing error in the evaluation of chamber time constant. In this paper, a 1 MHz wide window function in which only 10 samples of S21 are available was put under test and it was found a robust answer of chamber time constant can still be given by non-linear curve fitting techniques. Therefore the measurement time can be reduced and the frequency resolution of the chamber time constant can be increased at the same time.
{"title":"On measurement of reverberation chamber time constant and related curve fitting techniques","authors":"Xiaotian Zhang, M. Robinson, I. Flintoft","doi":"10.1109/ISEMC.2015.7256196","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256196","url":null,"abstract":"The reverberation chamber time constant quantifies how fast a reverberation chamber loses its stored energy at different frequencies, which makes it a very important parameter in many power related tests, such as the measurement of antenna efficiency, the measurement of absorption cross section, and the electromagnetic immunity test of electronic devices. The chamber time constant is usually obtained by doing regressions of power delay profile and calculating its gradient. But the shape of power delay profile can sometimes be distorted by the band limited window function applied in the frequency domain. A non-linear curve fitting technique which can cancel the effect of window function was developed, aiming to give a robust determination of the chamber time constant. With the help of this technique, window functions with much smaller bandwidth can be applied without introducing error in the evaluation of chamber time constant. In this paper, a 1 MHz wide window function in which only 10 samples of S21 are available was put under test and it was found a robust answer of chamber time constant can still be given by non-linear curve fitting techniques. Therefore the measurement time can be reduced and the frequency resolution of the chamber time constant can be increased at the same time.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115381404","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256128
Marco Grassi, Jean-Michel Redouté, A. Richelli
This paper presents an on-chip common-mode cancellation circuit which increases the immunity to electromagnetic interference (EMI) of integrated CMOS operational amplifiers when EMI is injected into their inputs. The circuits have been designed in the UMC 180nm CMOS technology. Two case studies have been considered: first, the common-mode cancellation circuit has been used in a Miller amplifier and secondly, in a folded cascode opamp topology. Circuit simulations and mathematical derivations illustrate how the proposed common-mode cancellation input stage strongly reduces the EMI susceptibility of both opamps, even in the presence of large amplitude interferences. The output offset voltages which are obtained when EMI amplitudes up to 3.3 Vpp are injected in the noninverting inputs of the proposed amplifiers when these are connected in a voltage follower configuration, are reduced by nearly one order of magnitude.
{"title":"Increased EMI immunity in CMOS operational amplifiers using an integrated common-mode cancellation circuit","authors":"Marco Grassi, Jean-Michel Redouté, A. Richelli","doi":"10.1109/ISEMC.2015.7256128","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256128","url":null,"abstract":"This paper presents an on-chip common-mode cancellation circuit which increases the immunity to electromagnetic interference (EMI) of integrated CMOS operational amplifiers when EMI is injected into their inputs. The circuits have been designed in the UMC 180nm CMOS technology. Two case studies have been considered: first, the common-mode cancellation circuit has been used in a Miller amplifier and secondly, in a folded cascode opamp topology. Circuit simulations and mathematical derivations illustrate how the proposed common-mode cancellation input stage strongly reduces the EMI susceptibility of both opamps, even in the presence of large amplitude interferences. The output offset voltages which are obtained when EMI amplitudes up to 3.3 Vpp are injected in the noninverting inputs of the proposed amplifiers when these are connected in a voltage follower configuration, are reduced by nearly one order of magnitude.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"133 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120973763","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256318
T. Peikert, H. Garbe, S. Potthast
This paper introduces a procedural method for the systematic risk analysis when an IT-System is exposed to an intentional electromagnetic environment (IEME). The method analyzes the susceptibility of an electronic system with the respect to intentional electromagnetic interferences (IEMI). It combines the advantage of fault tree analysis (FTA), electromagnetic topology (EMT) and Bayesian networks (BN) and enhance the statistical-based models for the coupling and the system behavior with uncertain data. The fuzzy approach in this paper adds to the statistical and crisp data, the uncertainness with linguistic terms. That terms treat the predication for that crisp data not exist or only reach with the utmost effort. In a final step the critical scenario are identify and the elements which contribute most to the risk.
{"title":"A fuzzy approach for IEMI risk analysis of IT-Systems with respect to transient disturbances","authors":"T. Peikert, H. Garbe, S. Potthast","doi":"10.1109/ISEMC.2015.7256318","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256318","url":null,"abstract":"This paper introduces a procedural method for the systematic risk analysis when an IT-System is exposed to an intentional electromagnetic environment (IEME). The method analyzes the susceptibility of an electronic system with the respect to intentional electromagnetic interferences (IEMI). It combines the advantage of fault tree analysis (FTA), electromagnetic topology (EMT) and Bayesian networks (BN) and enhance the statistical-based models for the coupling and the system behavior with uncertain data. The fuzzy approach in this paper adds to the statistical and crisp data, the uncertainness with linguistic terms. That terms treat the predication for that crisp data not exist or only reach with the utmost effort. In a final step the critical scenario are identify and the elements which contribute most to the risk.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122542165","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256322
Sebastian Koch, H. Gossner, H. Gieser, L. Maurer
An approach towards evaluating the ESD performance of high-speed interfaces is presented. By applying ESD stress to powered USB 3.0 interfaces the propagation of very short ESD pulses is investigated. Soft failures caused by TLP stress are put into relation to hard failure thresholds of the unpowered devices as well as soft failures induced by IEC 61000-4-2 pulses.
{"title":"ESD performance evaluation of powered high-speed interfaces","authors":"Sebastian Koch, H. Gossner, H. Gieser, L. Maurer","doi":"10.1109/ISEMC.2015.7256322","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256322","url":null,"abstract":"An approach towards evaluating the ESD performance of high-speed interfaces is presented. By applying ESD stress to powered USB 3.0 interfaces the propagation of very short ESD pulses is investigated. Soft failures caused by TLP stress are put into relation to hard failure thresholds of the unpowered devices as well as soft failures induced by IEC 61000-4-2 pulses.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"107 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122564342","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256203
B. Menssen, D. Hamann, H. Garbe
The standards by CISPR and IEC describe different procedures for the measurement of the radiated disturbance of electronic equipment. However, these standards only account for measuring the maximum radiated electric field strength for a specified number of sampling points. This leads to the assumption that especially for the characteristics of unintentional electromagnetic radiators, the specified amount of sampling points is not sufficient so that the true maximum of the electric field strength might be undetermined. Therefore, stochastic approaches were derived to predict the maximum radiated electric field strength based on the total radiated power. Above 1 GHz and without using a reverberation chamber, the determination of the total radiated power is very time consuming. Hence, a new approach is presented in this paper which uses standardized sampling approaches from alternative test methods to predict the maximum radiated electric field strength from a reduced number of angles of observation. Its accuracy and applicability as an extension for the emission measurements of unintentional electromagnetic radiators is assessed.
{"title":"Extension of the emission measurements for alternative test methods above 1 GHz for unintentional electromagnetic radiators","authors":"B. Menssen, D. Hamann, H. Garbe","doi":"10.1109/ISEMC.2015.7256203","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256203","url":null,"abstract":"The standards by CISPR and IEC describe different procedures for the measurement of the radiated disturbance of electronic equipment. However, these standards only account for measuring the maximum radiated electric field strength for a specified number of sampling points. This leads to the assumption that especially for the characteristics of unintentional electromagnetic radiators, the specified amount of sampling points is not sufficient so that the true maximum of the electric field strength might be undetermined. Therefore, stochastic approaches were derived to predict the maximum radiated electric field strength based on the total radiated power. Above 1 GHz and without using a reverberation chamber, the determination of the total radiated power is very time consuming. Hence, a new approach is presented in this paper which uses standardized sampling approaches from alternative test methods to predict the maximum radiated electric field strength from a reduced number of angles of observation. Its accuracy and applicability as an extension for the emission measurements of unintentional electromagnetic radiators is assessed.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"83 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122935099","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256219
Sebastian Bohmelt, Fabian Scharf, M. Dudzinski, M. Rozgic, L. Fichte, M. Stiemer
The impact of electromagnetic fields on biological tissue is increasingly gaining relevance for electromagnetic compatibility considerations. To estimate such effects, the determination of the electromagnetic exposition on the cellular level is essential. Hence, a new method for the finite element simulation of biological cells in electrolyte solution based on the electro-quasistatic approximation to Maxwell's equations is presented here. By non-overlapping iterative domain decomposition (IDD), a more efficient and accurate incorporation of surface charge relaxation on material interfaces is achieved than by former methods. IDD does not only lead to an efficient consideration of the interface coupling of electrical flux- and current densities, but also overcomes numerical problems related to size differences of individual cell components. A completely parallel treatment of the resulting subdomains will enable the simulation of large cell systems in the future. The approach is validated in the case of a time-harmonic external field. Further, numerical errors and convergence properties are analyzed.
{"title":"Finite element simulation of the frequency-dependent polarization of biological cells","authors":"Sebastian Bohmelt, Fabian Scharf, M. Dudzinski, M. Rozgic, L. Fichte, M. Stiemer","doi":"10.1109/ISEMC.2015.7256219","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256219","url":null,"abstract":"The impact of electromagnetic fields on biological tissue is increasingly gaining relevance for electromagnetic compatibility considerations. To estimate such effects, the determination of the electromagnetic exposition on the cellular level is essential. Hence, a new method for the finite element simulation of biological cells in electrolyte solution based on the electro-quasistatic approximation to Maxwell's equations is presented here. By non-overlapping iterative domain decomposition (IDD), a more efficient and accurate incorporation of surface charge relaxation on material interfaces is achieved than by former methods. IDD does not only lead to an efficient consideration of the interface coupling of electrical flux- and current densities, but also overcomes numerical problems related to size differences of individual cell components. A completely parallel treatment of the resulting subdomains will enable the simulation of large cell systems in the future. The approach is validated in the case of a time-harmonic external field. Further, numerical errors and convergence properties are analyzed.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114263547","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256190
T. Matsushima, O. Wada, K. Takaya, Y. Okugawa
Conducted disturbances from communication or power supply cables affect Ethernet devices. A conducted disturbance, which is generated when several switching power devices reach a communication device, degrades the quality of signal communications. In addition, a disturbance passing through an Ethernet device influences neighboring devices connected by the communication cables. Herein we propose a system to measure the propagation modes of conducted disturbances in power supply cables and Ethernet cables. The results indicate that mode conversion occurs in not only an Ethernet hub but also an AC adapter supplying DC voltage to Ethernet devices. The conducted disturbance to the AC and DC power supply cable is strongly transmitted to the Ethernet cable as the primary common mode and the differential mode. Conversion from the common mode in the power supply cable to the primary common mode in the Ethernet cable is dominant in the measured frequency range.
{"title":"Mode conversion and transfer characteristics of conducted disturbance to Ethernet device from power supply cable","authors":"T. Matsushima, O. Wada, K. Takaya, Y. Okugawa","doi":"10.1109/ISEMC.2015.7256190","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256190","url":null,"abstract":"Conducted disturbances from communication or power supply cables affect Ethernet devices. A conducted disturbance, which is generated when several switching power devices reach a communication device, degrades the quality of signal communications. In addition, a disturbance passing through an Ethernet device influences neighboring devices connected by the communication cables. Herein we propose a system to measure the propagation modes of conducted disturbances in power supply cables and Ethernet cables. The results indicate that mode conversion occurs in not only an Ethernet hub but also an AC adapter supplying DC voltage to Ethernet devices. The conducted disturbance to the AC and DC power supply cable is strongly transmitted to the Ethernet cable as the primary common mode and the differential mode. Conversion from the common mode in the power supply cable to the primary common mode in the Ethernet cable is dominant in the measured frequency range.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"107 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117253596","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256248
S. Jeschke, S. Tsiapenko, H. Hirsch
As a result of the power train electrification in electric and hybrid vehicles the electromagnetic compatibility of these vehicles is comprehensively affected. To ensure the electromagnetic compatibility of these vehicles the traction system is built up completely shielded and isolated from the vehicle chassis. Considering the shielding of the propulsion system the shaft of the traction drive represents a weak point. Due to stray capacitances of the drive's bearings the high frequent portions of the stator current can couple onto the shaft. These currents can flow through the gear box in direction of the wheels and possibly affect sensors of the 12V system. For EMC testing on component level, normally the common mode current on the cables between the inverter and the drive and between the inverter and the propulsion battery is considered. For the disturbances occurring on the battery cables alternatively the unsymmetrical voltage is measured using a high voltage coupling network. Considering the actual standard, a measurement of the shaft currents is actually not provided. Another point is that the measurements are normally tested in constant operating points, not representing the typical operation of a vehicle. Thus in this paper the shaft currents occurring in the traction system of an electric vehicle are investigated for constant and dynamic operation. For the investigation, a Hardware in the Loop (HiL) setup of an electric vehicle traction system with the ability to variably simulate dynamic drive scenarios is used. For the detection of the shaft currents, an inductive measurement transducer is used. The occurring EMI are measured using a Time Domain EMI Measurement system to analyze the EMI behavior and to indentify critical operating points during the dynamic operation of an electric vehicle.
{"title":"Investigations on the shaft currents of an electric vehicle traction system in dynamic operation","authors":"S. Jeschke, S. Tsiapenko, H. Hirsch","doi":"10.1109/ISEMC.2015.7256248","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256248","url":null,"abstract":"As a result of the power train electrification in electric and hybrid vehicles the electromagnetic compatibility of these vehicles is comprehensively affected. To ensure the electromagnetic compatibility of these vehicles the traction system is built up completely shielded and isolated from the vehicle chassis. Considering the shielding of the propulsion system the shaft of the traction drive represents a weak point. Due to stray capacitances of the drive's bearings the high frequent portions of the stator current can couple onto the shaft. These currents can flow through the gear box in direction of the wheels and possibly affect sensors of the 12V system. For EMC testing on component level, normally the common mode current on the cables between the inverter and the drive and between the inverter and the propulsion battery is considered. For the disturbances occurring on the battery cables alternatively the unsymmetrical voltage is measured using a high voltage coupling network. Considering the actual standard, a measurement of the shaft currents is actually not provided. Another point is that the measurements are normally tested in constant operating points, not representing the typical operation of a vehicle. Thus in this paper the shaft currents occurring in the traction system of an electric vehicle are investigated for constant and dynamic operation. For the investigation, a Hardware in the Loop (HiL) setup of an electric vehicle traction system with the ability to variably simulate dynamic drive scenarios is used. For the detection of the shaft currents, an inductive measurement transducer is used. The occurring EMI are measured using a Time Domain EMI Measurement system to analyze the EMI behavior and to indentify critical operating points during the dynamic operation of an electric vehicle.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129937920","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256175
Xiaowei Wang, R. Vick
The radiated emission testing of an electrically large equipment under test (EUT) has been carried out in a mode stirred chamber and a fully anechoic room. The radiation pattern of a rectangular metallic enclosure with a rectangular slot was measured, simulated and compared. The model of the EUT was then used for a statistical analysis of the expected value of the maximum directivity from 1GHz to 6GHz by numerical simulation. The statistical properties of the simulated directivity matches well with theoretical derivations. The results reveal that the expected value of the maximum directivity could be assumed as a function of electrical size of the EUT. The long term aim of the investigation is the estimation of the directivity of EUTs to correlate measurements of radiated emissions of electrically large EUTs in different test environments. By knowledge of directivity values and the measured total radiated power in an alternative test site, the maximum electric field strength of the EUT could be determined.
{"title":"Determination of radiated emissions of an electrically large EUT: Simulation and experiment","authors":"Xiaowei Wang, R. Vick","doi":"10.1109/ISEMC.2015.7256175","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256175","url":null,"abstract":"The radiated emission testing of an electrically large equipment under test (EUT) has been carried out in a mode stirred chamber and a fully anechoic room. The radiation pattern of a rectangular metallic enclosure with a rectangular slot was measured, simulated and compared. The model of the EUT was then used for a statistical analysis of the expected value of the maximum directivity from 1GHz to 6GHz by numerical simulation. The statistical properties of the simulated directivity matches well with theoretical derivations. The results reveal that the expected value of the maximum directivity could be assumed as a function of electrical size of the EUT. The long term aim of the investigation is the estimation of the directivity of EUTs to correlate measurements of radiated emissions of electrically large EUTs in different test environments. By knowledge of directivity values and the measured total radiated power in an alternative test site, the maximum electric field strength of the EUT could be determined.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"35 5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128452015","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-09-14DOI: 10.1109/ISEMC.2015.7256309
A. D’Aloia, M. D'amore, M. S. Sarto
The shielding performances of multilayer screens made of laminated graphene sheets with flexible polymeric interlayer depend on several factors such as thickness of the polymer interlayers, number of laminated graphene sheets, electron transport properties of graphene, and frequency range. Previous studies have highlighted that the frequency dependent graphene conductivity is a function of the charge carrier density, mobility and quantum scattering time, and it is strongly affected by doping and fabrication route. This paper is aimed at the analysis of the shielding performances of laminated graphene/polymer multilayers at terahertz, in order to provide insights on the optimum shield design as a function of frequency. The proposed simulation model accounts for the frequency dispersive properties of the graphene monolayer and of the polyethylene terephthalate (PET), which is considered as flexible polymeric interlayer material. The optimal choice of the substrate thickness is discussed in order to achieve the maximum value of the shielding effectiveness (SE) in the terahertz frequency range. The proposed design procedure is applied to three multilayer shield configurations, which are made of different types of chemically doped graphene. The computed frequency spectra of the shielding effectiveness up to 10 THz highlight the shielding performances of the considered samples.
{"title":"Optimal terahertz shielding performances of flexible multilayer screens based on chemically doped graphene on polymer substrate","authors":"A. D’Aloia, M. D'amore, M. S. Sarto","doi":"10.1109/ISEMC.2015.7256309","DOIUrl":"https://doi.org/10.1109/ISEMC.2015.7256309","url":null,"abstract":"The shielding performances of multilayer screens made of laminated graphene sheets with flexible polymeric interlayer depend on several factors such as thickness of the polymer interlayers, number of laminated graphene sheets, electron transport properties of graphene, and frequency range. Previous studies have highlighted that the frequency dependent graphene conductivity is a function of the charge carrier density, mobility and quantum scattering time, and it is strongly affected by doping and fabrication route. This paper is aimed at the analysis of the shielding performances of laminated graphene/polymer multilayers at terahertz, in order to provide insights on the optimum shield design as a function of frequency. The proposed simulation model accounts for the frequency dispersive properties of the graphene monolayer and of the polyethylene terephthalate (PET), which is considered as flexible polymeric interlayer material. The optimal choice of the substrate thickness is discussed in order to achieve the maximum value of the shielding effectiveness (SE) in the terahertz frequency range. The proposed design procedure is applied to three multilayer shield configurations, which are made of different types of chemically doped graphene. The computed frequency spectra of the shielding effectiveness up to 10 THz highlight the shielding performances of the considered samples.","PeriodicalId":412708,"journal":{"name":"2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128805846","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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