2022 IEEE International Integrated Reliability Workshop (IIRW)

Impact of Single Defects on NBTI and PBTI Recovery in SiO2 Transistors

Pub Date : 2022-10-09 DOI: 10.1109/IIRW56459.2022.10032748 K. Tselios, T. Knobloch, J. Michl, Dominic Waldhoer, C. Schleich, E. Ioannidis, H. Enichlmair, R. Minixhofer, T. Grasser, M. Waltl

Anomaly of NBTI data for PMOS transistors degraded by plasma processing induced charging damage (PID)

Pub Date : 2022-10-09 DOI: 10.1109/IIRW56459.2022.10032757 Andreas Martin, Lukáš Valdman, Benjamin Hamilton Stafford, H. Nielen

Simulating and Modeling the Influence of Deep Trench Interface Recombination on Si Photodiodes

Pub Date : 2022-10-09 DOI: 10.1109/IIRW56459.2022.10032736 Paul Stampfer, G. Meinhardt, T. Grasser, M. Waltl