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2013 IEEE International Test Conference (ITC)

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2013 IEEE International Test Conference (ITC)

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2013 IEEE International Test Conference (ITC) - 最新文献

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Self-repair of uncore components in robust system-on-chips: An OpenSPARC T2 case study

Pub Date : 2013-11-04 DOI: 10.1109/TEST.2013.6651907 Yanjing Li, E. Cheng, S. Makar, S. Mitra

Theory, model, and applications of non-Gaussian probability density functions for random jitter/noise with non-white power spectral densities

Pub Date : 2013-11-04 DOI: 10.1109/TEST.2013.6651910 Daniel Chow, Masashi Shimanouchi, Mike P. Li

AgentDiag: An agent-assisted diagnostic framework for board-level functional failures

Pub Date : 2013-11-04 DOI: 10.1109/TEST.2013.6651918 Zelong Sun, Li Jiang, Q. Xu, Zhaobo Zhang, Zhiyuan Wang, Xinli Gu
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