Advances in x-ray analysis

Determination of thickness and composition of thin Al{sub x}Ga{sub 1-x}As layers on GaAs by total electron yield (TEY)

Pub Date : 1995-12-31 DOI: 10.1154/s0376030800017729 M. Ebel, R. Svagera, H. Ebel, Robert Hobl, M. Mantler, J. Wernisch, N. Zagler

Neutron and x-ray scattering studies of the metallurgical condition and residual stresses in Weldalite welds

Pub Date : 1995-12-31 DOI: 10.2172/206556 S. Spooner, E. Pardue

Residual stress and microstructural characterization using Rietveld refinement of a carburized layer in a 5120 steel

Pub Date : 1995-09-01 DOI: 10.2172/106610 P. Rangaswamy, M. Bourke, A. Lawson, J. Orourke, J. Goldstone