Design Considerations for a Surface Disinfection Device Using Ultraviolet-C Light-Emitting Diodes.

IF 1.5 4区 工程技术 Journal of Research of the National Institute of Standards and Technology Pub Date : 2022-02-16 eCollection Date: 2021-01-01 DOI:10.6028/jres.126.045
Pratibha Sharma, Pao Chen, Saya Han, Peter Chung, Jungpin Chen, Justin Tseng, Chang Han
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Abstract

Ultraviolet-C (UV-C) radiation, spanning wavelengths between 200 nm and 280 nm, has proven germicidal qualities and medical, industrial, and environmental applications. The need for new disinfection technologies and the prospect of eliminating mercury-based radiation sources compels research on ultraviolet (UV) light-emitting diodes (LEDs). UV-LED technology could be used for customized and point-of-use products for disinfection and sterilization. We focused on the design and development of a surface disinfection device using UV-C LEDs, including potential user targets, important design parameters, and final validation methods. Optical and thermal simulations were used to illustrate the design process and associated challenges. A sample device prototype was developed, and microbial validation results are presented.

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使用紫外线 C 发光二极管的表面消毒装置的设计考虑因素。
波长介于 200 纳米和 280 纳米之间的紫外线-C(UV-C)辐射已被证明具有杀菌效果,可用于医疗、工业和环境领域。对新消毒技术的需求和消除汞基辐射源的前景迫使人们对紫外线(UV)发光二极管(LED)进行研究。紫外线发光二极管技术可用于定制和使用点产品的消毒和灭菌。我们重点研究了使用紫外线-C LED 的表面消毒设备的设计和开发,包括潜在用户目标、重要设计参数和最终验证方法。我们使用光学和热模拟来说明设计过程和相关挑战。开发了一个样品设备原型,并介绍了微生物验证结果。
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期刊介绍: The Journal of Research of the National Institute of Standards and Technology is the flagship publication of the National Institute of Standards and Technology. It has been published under various titles and forms since 1904, with its roots as Scientific Papers issued as the Bulletin of the Bureau of Standards. In 1928, the Scientific Papers were combined with Technologic Papers, which reported results of investigations of material and methods of testing. This new publication was titled the Bureau of Standards Journal of Research. The Journal of Research of NIST reports NIST research and development in metrology and related fields of physical science, engineering, applied mathematics, statistics, biotechnology, information technology.
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