Numerical Corrections to Estimate Depletion Region Width in Pseudo-two-dimensional Model of Double-Gate Tunneling FET

Muhammad Elgamal, A. Shaker
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Abstract

There is always a great demand for TFET analytical models to understand its underlined physics. One of the most widely known and citable models is the pseudo model as it gives satisfying results compared to TCAD simulations. However, the calculation of the depletion regions lengths is erroneous when using fully analytical solutions. The base on which the depletion regions is calculated should be revised to accurately model the electrostatic potential. In this work, we review the expressions that are based on pn junction assumption regarding the depletion regions lengths. A discussion is provided to prove the inability of the used equation to correctly predict the depletion lengths inside the source and the drain.
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双栅隧道场效应管伪二维模型中损耗区宽度估计的数值修正
为了更好地理解其突出的物理特性,对ttfet分析模型的需求一直很大。伪模型是最广为人知和最常被引用的模型之一,因为与TCAD仿真相比,它能给出令人满意的结果。然而,当使用完全解析解时,耗尽区长度的计算是错误的。计算耗尽区所依据的基础应加以修正,以准确地模拟静电势。在这项工作中,我们回顾了关于耗尽区长度的基于pn结假设的表达式。讨论了所使用的方程不能正确地预测源和漏内的耗尽长度。
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