Jeong-Hwan Kim, Jin-Seob Kang, J. Kwon, Dae-Chan Kim
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引用次数: 1
Abstract
This paper presents a method using a two-tier calibration with ‘Thru-Line’ for evaluating the S-parameters of adapters based on three-adapter technique. It uses a one-port VNA (Vector Network Analyzer) to avoid cable movements with ‘OSL’ (Open-Short-Load) calibration standards, which are widely used for one-port measurements, being used at the first and second calibrations. Formulas are also derived for estimating the uncertainties of the S-parameters of adaptors using the proposed method.
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