{"title":"Contactless distance measurement method","authors":"K. Hoffmann, Z. Škvor","doi":"10.1109/ARFTG77.2011.6034559","DOIUrl":null,"url":null,"abstract":"A new method capable of contactless distance measurement with high resolution has been proposed. The method is intended to measure distance differences smaller than one half of a wavelength. First experimental results are reported. The method is based on precise phase evaluation of signal reflected by the surface whose distance is measured. This is achieved using interference between the reflected and reference signals. Micrometer resolution at 10 GHz can be expected.","PeriodicalId":257372,"journal":{"name":"77th ARFTG Microwave Measurement Conference","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-06-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"77th ARFTG Microwave Measurement Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG77.2011.6034559","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
A new method capable of contactless distance measurement with high resolution has been proposed. The method is intended to measure distance differences smaller than one half of a wavelength. First experimental results are reported. The method is based on precise phase evaluation of signal reflected by the surface whose distance is measured. This is achieved using interference between the reflected and reference signals. Micrometer resolution at 10 GHz can be expected.
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