Mechanical Behavior of Lead-free Solder at High Temperatures and High Strain Rates

X. Long, Tianxiong Su, Chao Chang, Jia-Qiang Huang, Xiaotong Chang, Yutai Su, Hongbin Shi, Tao Huang, Yan-pei Wu
{"title":"Mechanical Behavior of Lead-free Solder at High Temperatures and High Strain Rates","authors":"X. Long, Tianxiong Su, Chao Chang, Jia-Qiang Huang, Xiaotong Chang, Yutai Su, Hongbin Shi, Tao Huang, Yan-pei Wu","doi":"10.1109/ICEPT52650.2021.9568200","DOIUrl":null,"url":null,"abstract":"While moving ahead with science and technology., the service conditions of microelectronic devices are becoming more and more complicated., and the performance requirements of packaging materials are also increasing especially for hash applications. The dependability of solder joints in electronic chips under high temperatures and high strain rates have attracted much attention. In this paper., experimental studies are carried out on the dynamic behavior of Sn-3.0Ag-0.5Cu (SAC305) materials. The dynamic compression experiments are operated by using the Split-Hopkinson Pressure Bar (SHPB) with a heating furnace to achieve the target temperature condition. The true stress- strain curves are received by this system at a temperature of 343K and the strain rates from 959 ${\\mathrm{s}^{-1}}$ to ${1961\\ {\\mathrm{s}^{-1}}}$. Additionally., in order to investigate the deformation mechanism under impact scenarios., an optical microscopy is utilized to characterize the microstructure of the SAC305 lead-free solder specimen at high temperatures and high strain rates.","PeriodicalId":184693,"journal":{"name":"2021 22nd International Conference on Electronic Packaging Technology (ICEPT)","volume":"351 ","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 22nd International Conference on Electronic Packaging Technology (ICEPT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEPT52650.2021.9568200","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

While moving ahead with science and technology., the service conditions of microelectronic devices are becoming more and more complicated., and the performance requirements of packaging materials are also increasing especially for hash applications. The dependability of solder joints in electronic chips under high temperatures and high strain rates have attracted much attention. In this paper., experimental studies are carried out on the dynamic behavior of Sn-3.0Ag-0.5Cu (SAC305) materials. The dynamic compression experiments are operated by using the Split-Hopkinson Pressure Bar (SHPB) with a heating furnace to achieve the target temperature condition. The true stress- strain curves are received by this system at a temperature of 343K and the strain rates from 959 ${\mathrm{s}^{-1}}$ to ${1961\ {\mathrm{s}^{-1}}}$. Additionally., in order to investigate the deformation mechanism under impact scenarios., an optical microscopy is utilized to characterize the microstructure of the SAC305 lead-free solder specimen at high temperatures and high strain rates.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
无铅焊料在高温和高应变速率下的力学行为
在科技进步的同时。微电子器件的使用条件变得越来越复杂。,特别是散列应用对包装材料的性能要求也越来越高。电子芯片中焊点在高温、高应变速率下的可靠性一直受到人们的关注。在本文中。,对Sn-3.0Ag-0.5Cu (SAC305)材料的动力学行为进行了实验研究。采用带加热炉的Split-Hopkinson压杆(SHPB)进行动态压缩实验,以达到目标温度条件。在温度为343K、应变速率为959 ${\mathrm{s}^{-1}}$到${1961\ {\mathrm{s}^{-1}}}$的范围内,得到了该系统的真实应力应变曲线。此外。,以研究冲击情景下的变形机制。利用光学显微镜对SAC305无铅焊料试样在高温、高应变速率下的微观结构进行了表征。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Study on the mechanical properties of ultra-low dielectric film by tensile test Mechanical Behavior of Lead-free Solder at High Temperatures and High Strain Rates Thermal Stress Study of 3D IC Based on TSV and Verification of Thermal Dissipation of STI Defect Localization and Optimization of PIND for Large Size CQFP Devices A Novel Bumping Method for Flip-Chip Interconnection
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1