X. Long, Tianxiong Su, Chao Chang, Jia-Qiang Huang, Xiaotong Chang, Yutai Su, Hongbin Shi, Tao Huang, Yan-pei Wu
{"title":"Mechanical Behavior of Lead-free Solder at High Temperatures and High Strain Rates","authors":"X. Long, Tianxiong Su, Chao Chang, Jia-Qiang Huang, Xiaotong Chang, Yutai Su, Hongbin Shi, Tao Huang, Yan-pei Wu","doi":"10.1109/ICEPT52650.2021.9568200","DOIUrl":null,"url":null,"abstract":"While moving ahead with science and technology., the service conditions of microelectronic devices are becoming more and more complicated., and the performance requirements of packaging materials are also increasing especially for hash applications. The dependability of solder joints in electronic chips under high temperatures and high strain rates have attracted much attention. In this paper., experimental studies are carried out on the dynamic behavior of Sn-3.0Ag-0.5Cu (SAC305) materials. The dynamic compression experiments are operated by using the Split-Hopkinson Pressure Bar (SHPB) with a heating furnace to achieve the target temperature condition. The true stress- strain curves are received by this system at a temperature of 343K and the strain rates from 959 ${\\mathrm{s}^{-1}}$ to ${1961\\ {\\mathrm{s}^{-1}}}$. Additionally., in order to investigate the deformation mechanism under impact scenarios., an optical microscopy is utilized to characterize the microstructure of the SAC305 lead-free solder specimen at high temperatures and high strain rates.","PeriodicalId":184693,"journal":{"name":"2021 22nd International Conference on Electronic Packaging Technology (ICEPT)","volume":"351 ","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-09-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 22nd International Conference on Electronic Packaging Technology (ICEPT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEPT52650.2021.9568200","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
While moving ahead with science and technology., the service conditions of microelectronic devices are becoming more and more complicated., and the performance requirements of packaging materials are also increasing especially for hash applications. The dependability of solder joints in electronic chips under high temperatures and high strain rates have attracted much attention. In this paper., experimental studies are carried out on the dynamic behavior of Sn-3.0Ag-0.5Cu (SAC305) materials. The dynamic compression experiments are operated by using the Split-Hopkinson Pressure Bar (SHPB) with a heating furnace to achieve the target temperature condition. The true stress- strain curves are received by this system at a temperature of 343K and the strain rates from 959 ${\mathrm{s}^{-1}}$ to ${1961\ {\mathrm{s}^{-1}}}$. Additionally., in order to investigate the deformation mechanism under impact scenarios., an optical microscopy is utilized to characterize the microstructure of the SAC305 lead-free solder specimen at high temperatures and high strain rates.