{"title":"Advanced technologies and their impact on EMC standardization and EMC measurement techniques","authors":"K.-D. Gopel","doi":"10.1109/ICEMIC.1999.871636","DOIUrl":null,"url":null,"abstract":"New technologies in combination with the demand from the market will affect future work in EMC standardization, test concepts as well as the development of new EMC test instrumentation and systems. Trends can already be recognized. The paper describes the market demands, technology trends in different product areas and current changes in EMC standardization. Some of the requirements for new EMC measurement techniques are derived from this consideration.","PeriodicalId":104361,"journal":{"name":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility","volume":"53 6","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEMIC.1999.871636","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
New technologies in combination with the demand from the market will affect future work in EMC standardization, test concepts as well as the development of new EMC test instrumentation and systems. Trends can already be recognized. The paper describes the market demands, technology trends in different product areas and current changes in EMC standardization. Some of the requirements for new EMC measurement techniques are derived from this consideration.
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