S. Matsuo, Kensuke Tokumi, T. Tomita, S. Hashimoto
{"title":"Three-dimensional residue-free volume removal inside sapphire by high-temperature etching after irradiation of femtosecond laser Pulses","authors":"S. Matsuo, Kensuke Tokumi, T. Tomita, S. Hashimoto","doi":"10.1155/2008/892721","DOIUrl":null,"url":null,"abstract":"We applied the femtosecond laser-assisted etching technique, that is, irradiation of focused femtosecond \nlaser pulses followed by selective chemical etching, to volume removal inside sapphire. \nAt room temperature, volume etching only slightly advanced while residue remained inside the \nvolume. By increasing the etching temperature, complete volume etching without residue was \nachieved. Complete etching was, however, accompanied by undesirable phenomena of surface pits \nor cracks, which are expected to be excluded through further improvement of processing.","PeriodicalId":296295,"journal":{"name":"Laser Chemistry","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Laser Chemistry","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1155/2008/892721","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 12
Abstract
We applied the femtosecond laser-assisted etching technique, that is, irradiation of focused femtosecond
laser pulses followed by selective chemical etching, to volume removal inside sapphire.
At room temperature, volume etching only slightly advanced while residue remained inside the
volume. By increasing the etching temperature, complete volume etching without residue was
achieved. Complete etching was, however, accompanied by undesirable phenomena of surface pits
or cracks, which are expected to be excluded through further improvement of processing.