Oxide Thin Film Heterostructures on Large Area, with Flexible Doping, Low Dislocation Density, and Abrupt Interfaces: Grown by Pulsed Laser Deposition

M. Lorenz, H. Hochmuth, C. Grüner, H. Hilmer, A. Lajn, D. Spemann, M. Brandt, J. Zippel, R. Schmidt‐Grund, H. von Wenckstern, M. Grundmann
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引用次数: 25

Abstract

Advanced Pulsed Laser Deposition (PLD) processes allow the growth of oxide thin film heterostructures on large area substrates up to 4-inch diameter, with flexible and controlled doping, low dislocation density, and abrupt interfaces. These PLD processes are discussed and their capabilities demonstrated using selected results of structural, electrical, and optical characterization of superconducting (YBa 2Cu 3O 7−δ), semiconducting (ZnO-based), and ferroelectric (BaTiO 3-based) and dielectric (wide-gap oxide) thin films and multilayers. Regarding the homogeneity on large area of structure and electrical properties, flexibility of doping, and state-of-the-art electronic and optical performance, the comparably simple PLD processes are now advantageous or at least fully competitive to Metal Organic Chemical Vapor Deposition or Molecular Beam Epitaxy. In particular, the high flexibility connected with high film quality makes PLD a more and more widespread growth technique in oxide research.
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具有柔性掺杂、低位错密度和突然界面的大面积氧化薄膜异质结构:脉冲激光沉积生长
先进的脉冲激光沉积(PLD)工艺允许在直径达4英寸的大面积衬底上生长氧化薄膜异质结构,具有灵活和可控的掺杂,低位错密度和突然界面。讨论了这些PLD工艺,并利用超导(YBa 2Cu 30o 7−δ),半导体(zno基),铁电(batio3基)和介电(宽间隙氧化物)薄膜和多层膜的结构,电学和光学表征的选择结果证明了它们的能力。相对于金属有机化学气相沉积或分子束外延而言,相对简单的PLD工艺在大面积结构和电学性能的均匀性、掺杂的灵活性以及最先进的电子和光学性能方面具有优势或至少完全具有竞争力。特别是高柔韧性和高薄膜质量使得PLD成为氧化物研究中越来越广泛的生长技术。
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