Open/folded bit-line arrangement for ultra high-density DRAMs

D. Takashima, S. Watanabe, H. Nakano, Y. Oowaki, K. Ohuchi
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引用次数: 43

Abstract

A new open/folded bit-line (BL) arrangement for ultra high-density DRAMs is proposed. The proposed arrangement was successfully verified by the test chip. This arrangement features a 6F/sup 2/ memory cell and relaxed sensing amplifier of 3 times the pitch of BL. The chip size with this arrangement can be reduced to 81.6% of that of the folded BL arrangement, without introducing the complicated memory cell structure and without sacrificing access speed and power dissipation. Moreover, the proposed arrangement has good array noise immunity in scaled DRAMs compared with the folded BL arrangement. This arrangement is one of the leading candidates for ultra high-density DRAMs.
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超高密度dram的开/折叠位线排列
提出了一种用于超高密度dram的开/折叠位线(BL)结构。测试芯片成功地验证了所提出的安排。这种布局的特点是6F/sup /存储单元和3倍于BL间距的放松感测放大器,在不引入复杂的存储单元结构的情况下,可以将芯片尺寸缩小到折叠BL布局的81.6%,并且不会牺牲访问速度和功耗。此外,与折叠BL排列相比,该排列在缩放dram中具有良好的阵列抗扰性。这种排列是超高密度dram的主要候选之一。
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Open/folded bit-line arrangement for ultra high-density DRAMs A new very fast pull-in PLL system with anti-pseudo-lock function A 3 V data transceiver chip for dual-mode cellular communication systems A 12.5 ns 16 Mb CMOS SRAM Low voltage mixed analog/digital circuit design for portable equipment
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