Reliability-Equivalent Field Reference Usage and Stress Level When Both are Random for Product with Weibull Life Distribution

Abstract

This paper derives, based on reliability equivalence principle, the analytic expression of the equivalent singlevalued usage and stress level when the underlying life distribution is Weibull with a known shape parameter (slope). Numerical example is provided to illustrate the advantage of the method for reliability life test design over the traditional practice, especially for a high-reliability product.