A Life Test Method for Rapidly Obtaining the Degradation Trend of Sensitive Parameters

Abstract

In this paper, a theory and method for rapidly obtaining the degradation trend life test of sensitive parameters is introduced, which is suitable for the rapid test and evaluation of the life of electronic components. The theory of life data analysis comes from the exploratory data method (EDA),. The technical realization of rapidly obtaining the degradation trend of sensitive parameters depends on reducing the interference of test stress fluctuation to the measurement under the condition ofhigh stability test stress, and at the same time, the degradation sensitive parameters of the tested products are measured with high precision. The measured data are collected at high speed, and the degradation model of sensitive parameters with time is established on-line, and the extrapolation life of the sample is calculated according to the degradation model. For integrated circuit products, we have developed the corresponding test verification system, carried out the SRAM standby life and FPGA working life of limited samples, and explored the possibility of rapidly obtaining the degradation trend of sensitive parameters in the test method. It lays a foundation for further practical research in the future.