FPGA-Based Low-level CAN Protocol Testing

M. Mostafa, M. Shalan, S. Hammad
{"title":"FPGA-Based Low-level CAN Protocol Testing","authors":"M. Mostafa, M. Shalan, S. Hammad","doi":"10.1109/IWSOC.2006.348233","DOIUrl":null,"url":null,"abstract":"The paper proposes a new approach for testing a CAN bus at the bit-level. It depends on generation of bus errors to cover crucial corner cases. The design makes it possible to go beyond regular frame level testing that is provided by many commercial tools. It goes deep in bit-stream level testing and injection. The proposed design is verified using an FPGA system on chip. Verification results are good against design requirements","PeriodicalId":134742,"journal":{"name":"2006 6th International Workshop on System on Chip for Real Time Applications","volume":"18 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2006-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2006 6th International Workshop on System on Chip for Real Time Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IWSOC.2006.348233","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

Abstract

The paper proposes a new approach for testing a CAN bus at the bit-level. It depends on generation of bus errors to cover crucial corner cases. The design makes it possible to go beyond regular frame level testing that is provided by many commercial tools. It goes deep in bit-stream level testing and injection. The proposed design is verified using an FPGA system on chip. Verification results are good against design requirements
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
基于fpga的低级CAN协议测试
本文提出了一种位级测试CAN总线的新方法。它依赖于总线错误的生成来覆盖关键的极端情况。这种设计可以超越许多商业工具提供的常规框架水平测试。它深入到比特流级测试和注入。通过FPGA片上系统验证了所提出的设计。验证结果符合设计要求
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
FPGA-Based Low-level CAN Protocol Testing A generic method for fault injection in circuits SoC Design Quality, Cycletime, and Yield Improvement Through DfM A Benchmark Approach for Compilers in Reconfigurable Hardware Fragmentation Aware Placement in Reconfigurable Devices
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1