Implementing serial bus interfaces with general purpose digital instrumentation

Dale Johnson
{"title":"Implementing serial bus interfaces with general purpose digital instrumentation","authors":"Dale Johnson","doi":"10.1109/autest.2009.5314057","DOIUrl":null,"url":null,"abstract":"The use of generic digital test instruments for emulating common serial bus protocols can provide benefits over dedicated bus test products, and often presents a trade-off between functionality, flexibility and cost. For example, a dedicated test instrument solution can offer more extensive test capabilities such as protocol support for controlling and analyzing traffic between a bus controller and a device under test. However, a more general-purpose solution that utilizes a digital test instrument can offer the flexibility to adapt to non-standard line rates and timing as well as supporting other digital test needs. Ultimately, the goal is to identify those instances where the clever or novel application of a general-purpose digital test tool is appropriate and provides tangible benefits. This paper presents an overview of how a general-purpose digital I/O instrument can used to support three widely used serial bus interfaces. By using a general-purpose digital I/O solution, users can potentially realize a lower cost test solution, a more compact test system footprint, multi-site test capability, a common user control interface and expandability for future requirements.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"125 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 IEEE AUTOTESTCON","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/autest.2009.5314057","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

The use of generic digital test instruments for emulating common serial bus protocols can provide benefits over dedicated bus test products, and often presents a trade-off between functionality, flexibility and cost. For example, a dedicated test instrument solution can offer more extensive test capabilities such as protocol support for controlling and analyzing traffic between a bus controller and a device under test. However, a more general-purpose solution that utilizes a digital test instrument can offer the flexibility to adapt to non-standard line rates and timing as well as supporting other digital test needs. Ultimately, the goal is to identify those instances where the clever or novel application of a general-purpose digital test tool is appropriate and provides tangible benefits. This paper presents an overview of how a general-purpose digital I/O instrument can used to support three widely used serial bus interfaces. By using a general-purpose digital I/O solution, users can potentially realize a lower cost test solution, a more compact test system footprint, multi-site test capability, a common user control interface and expandability for future requirements.
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实现串行总线接口与通用数字仪表
使用通用数字测试仪器来模拟通用串行总线协议可以提供比专用总线测试产品更好的优势,并且通常在功能、灵活性和成本之间进行权衡。例如,专用测试仪器解决方案可以提供更广泛的测试功能,例如协议支持控制和分析总线控制器与被测设备之间的流量。然而,一个更通用的解决方案,利用数字测试仪器可以提供灵活性,以适应非标准的线路速率和定时,以及支持其他数字测试需求。最终,目标是确定那些实例,在这些实例中,通用数字测试工具的聪明或新颖的应用程序是合适的,并提供切实的好处。本文概述了如何使用通用数字I/O仪器来支持三种广泛使用的串行总线接口。通过使用通用数字I/O解决方案,用户可以潜在地实现更低成本的测试解决方案,更紧凑的测试系统足迹,多站点测试能力,通用用户控制界面和未来需求的可扩展性。
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