Pub Date : 2010-07-26DOI: 10.1109/MIM.2010.5521860
Simon M. Jessop, J. Reimann, P. Kalgren
Intermediate level avionics maintenance requires diagnostic assessment, repair, and flight certification steps. The current Automated Test Systems (ATS) are primarily designed to verify equipment end-to-end function (flight certification), so they are not optimized to support diagnostic procedures. An operator typically performs problem diagnosis at the beginning of the end-to-end test without any automated access to existing evidence of the likely failure. Test Program Set (TPS) routines can take hours for a functioning unit and much longer if repairs are necessary.
{"title":"Common S2ENCE maintenance","authors":"Simon M. Jessop, J. Reimann, P. Kalgren","doi":"10.1109/MIM.2010.5521860","DOIUrl":"https://doi.org/10.1109/MIM.2010.5521860","url":null,"abstract":"Intermediate level avionics maintenance requires diagnostic assessment, repair, and flight certification steps. The current Automated Test Systems (ATS) are primarily designed to verify equipment end-to-end function (flight certification), so they are not optimized to support diagnostic procedures. An operator typically performs problem diagnosis at the beginning of the end-to-end test without any automated access to existing evidence of the likely failure. Test Program Set (TPS) routines can take hours for a functioning unit and much longer if repairs are necessary.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-07-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115830117","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-11-06DOI: 10.1109/AUTEST.2009.5314050
Li Baoan, Zhihua Liu, Shufen Li
This paper presents an UAV fault and state prediction approach which is based on particle filter. In the UAV system, on account of its dynamic environment, mechanical complexity and other factors, it is difficult to avoid all potential faults. So, in order to early detect the potential fault, fault forecast is necessary so as to avoid enormous losses. As the input and output response model of UAV system is nonlinear and multi-parameters, it is need to find an appropriate way to of fault prediction for system maintenance and real-time command. Particle filters are sequential Monte Carlo methods based on point mass (or ‘particle’) representations of probability densities, which can be applied to any state-space model. Their ability to deal with nonlinear and non-Gaussian statistics makes them suitable for application to the UAV fault prediction. UAV is an extremely complex system, two important aspects of monitoring are focused on this paper: 1) Engine condition monitoring and fault prediction; 2) UAV flight track forecast. The experimental result indicates the effectiveness of this approach.
{"title":"Research of UAV fault and state forecast technology based on particle filter","authors":"Li Baoan, Zhihua Liu, Shufen Li","doi":"10.1109/AUTEST.2009.5314050","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314050","url":null,"abstract":"This paper presents an UAV fault and state prediction approach which is based on particle filter. In the UAV system, on account of its dynamic environment, mechanical complexity and other factors, it is difficult to avoid all potential faults. So, in order to early detect the potential fault, fault forecast is necessary so as to avoid enormous losses. As the input and output response model of UAV system is nonlinear and multi-parameters, it is need to find an appropriate way to of fault prediction for system maintenance and real-time command. Particle filters are sequential Monte Carlo methods based on point mass (or ‘particle’) representations of probability densities, which can be applied to any state-space model. Their ability to deal with nonlinear and non-Gaussian statistics makes them suitable for application to the UAV fault prediction. UAV is an extremely complex system, two important aspects of monitoring are focused on this paper: 1) Engine condition monitoring and fault prediction; 2) UAV flight track forecast. The experimental result indicates the effectiveness of this approach.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121141310","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-11-06DOI: 10.1109/AUTEST.2009.5314043
L. Mohrmann, Jason Tongen, M. Friedman, M. Wetzel
As test systems grow larger with higher channel counts and faster digitization, new techniques are needed for managing and processing the large amount of data being generated. One technique to handle this is with multiple computing nodes to distribute the acquisition, processing and data storage. Current communication busses exist to create a multicomputer system but must often make tradeoffs in terms of bandwidth or latency capabilities. In this paper we will look at using the PCI and PCI Express busses to create both a high bandwidth and low latency multi-computing system.
{"title":"Creating multicomputer test systems using PCI and PCI Express","authors":"L. Mohrmann, Jason Tongen, M. Friedman, M. Wetzel","doi":"10.1109/AUTEST.2009.5314043","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314043","url":null,"abstract":"As test systems grow larger with higher channel counts and faster digitization, new techniques are needed for managing and processing the large amount of data being generated. One technique to handle this is with multiple computing nodes to distribute the acquisition, processing and data storage. Current communication busses exist to create a multicomputer system but must often make tradeoffs in terms of bandwidth or latency capabilities. In this paper we will look at using the PCI and PCI Express busses to create both a high bandwidth and low latency multi-computing system.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123423007","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-11-06DOI: 10.1109/AUTEST.2009.5314029
Michael VanOverloop, Shane A. Peterson
This paper will cover the use of Critical Chain Project Management (CCPM) in program management for the Support Engineering community at IDS in St. Louis. The use of CCPM in Support Engineering initially began in the Mechanical/Electrical group in mid-2003. In late 2006, CCPM was also applied on other programs. The application of CCPM in the Mechanical/Electrical group was to aid in managing the complexity of working multiple programs simultaneously. Based on its success in reducing cost and cycle time, CCPT was applied to ATE projects to manage the complexity of the multiple subsystems being developed within one project. In a CCPM model of a project, the buffers are aggregated from individual task to provide visible safety for the entire project task network. There are two main types of buffers; Project Buffers and Feeder Buffers. The Project Buffers This paper will show how the deployment of CCPM has progressed from handling basic linear projects individually, to handling multiple linear projects, to handling large scale ATE projects with high degrees of imbedded complexity and parallel development efforts. In addition, this paper will describe the techniques developed for handling parallel development efforts, while maintaining the integrity of the CCPM project management data and will also show that the use of CCPM is completely compatible with Earned Value. Finally, this paper will describe the thirteen step process for back-chaining task networks used in CCPM produces executable project plans and it will also describe how CCPM can be used to develop program planning during the proposal phase of projects.
{"title":"Application of CCPM in ATE Program Management","authors":"Michael VanOverloop, Shane A. Peterson","doi":"10.1109/AUTEST.2009.5314029","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314029","url":null,"abstract":"This paper will cover the use of Critical Chain Project Management (CCPM) in program management for the Support Engineering community at IDS in St. Louis. The use of CCPM in Support Engineering initially began in the Mechanical/Electrical group in mid-2003. In late 2006, CCPM was also applied on other programs. The application of CCPM in the Mechanical/Electrical group was to aid in managing the complexity of working multiple programs simultaneously. Based on its success in reducing cost and cycle time, CCPT was applied to ATE projects to manage the complexity of the multiple subsystems being developed within one project. In a CCPM model of a project, the buffers are aggregated from individual task to provide visible safety for the entire project task network. There are two main types of buffers; Project Buffers and Feeder Buffers. The Project Buffers This paper will show how the deployment of CCPM has progressed from handling basic linear projects individually, to handling multiple linear projects, to handling large scale ATE projects with high degrees of imbedded complexity and parallel development efforts. In addition, this paper will describe the techniques developed for handling parallel development efforts, while maintaining the integrity of the CCPM project management data and will also show that the use of CCPM is completely compatible with Earned Value. Finally, this paper will describe the thirteen step process for back-chaining task networks used in CCPM produces executable project plans and it will also describe how CCPM can be used to develop program planning during the proposal phase of projects.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115203014","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-11-06DOI: 10.1109/AUTEST.2009.5314032
J. Hansen
High test signal power provides multiple advantages within the RF test environment. It can mean greater accuracy of measurements and the ability to evaluate devices over a larger dynamic range. This in turn results in a wider breadth of capability from the test system ensuring coverage of the boundary conditions that may affect system readiness. Long cable runs and switch matrices that consume signal power before the test signal gets to the device under test aggravate the problem.
{"title":"Generating higher output power signals for today's test applications","authors":"J. Hansen","doi":"10.1109/AUTEST.2009.5314032","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314032","url":null,"abstract":"High test signal power provides multiple advantages within the RF test environment. It can mean greater accuracy of measurements and the ability to evaluate devices over a larger dynamic range. This in turn results in a wider breadth of capability from the test system ensuring coverage of the boundary conditions that may affect system readiness. Long cable runs and switch matrices that consume signal power before the test signal gets to the device under test aggravate the problem.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122949713","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-11-06DOI: 10.1109/AUTEST.2009.5314000
M. Cornish, Malcolm Brown, J. Ganzert
A fourth in a series of studies, sponsored by the UK MoD, explores gain and 1 dB compression point, for a mobile communications device, through IEEE Std. 1641™ Signal & Test Definition [1]. The study adds depth to the use of load, Power and Physical types, along with methods for capability description of test resources, through IEEE ATML [2]. In addition, comparison is made with previous studies, in particular that into RF stimulus & measurement [5]. The implementation platform consists of Rohde & Schwarz's Vector Signal Generator, Spectrum Analyser & Vector Network Analyser. The tests are defined using the Standard's Test Signal Framework (TSF); use is made of the Standard's Signal Modelling Language to validate the behaviour of the test signals; IEEE ATML Test Station is used to describe the mapping onto the test resources; an XML document is written to describe the mapping to the test resource IVI drivers; and, an IEEE 1641 defined COM interface is used access these documents. By producing a test program that conforms to the IEEE 1641 defined interfaces, it is shown that the defined tests can be validated, translated to the test platform's native IVI and executed, all using the same source.
{"title":"Implementing IEEE 1641 - amplifier characterisation on multiple test platforms","authors":"M. Cornish, Malcolm Brown, J. Ganzert","doi":"10.1109/AUTEST.2009.5314000","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314000","url":null,"abstract":"A fourth in a series of studies, sponsored by the UK MoD, explores gain and 1 dB compression point, for a mobile communications device, through IEEE Std. 1641™ Signal & Test Definition [1]. The study adds depth to the use of load, Power and Physical types, along with methods for capability description of test resources, through IEEE ATML [2]. In addition, comparison is made with previous studies, in particular that into RF stimulus & measurement [5]. The implementation platform consists of Rohde & Schwarz's Vector Signal Generator, Spectrum Analyser & Vector Network Analyser. The tests are defined using the Standard's Test Signal Framework (TSF); use is made of the Standard's Signal Modelling Language to validate the behaviour of the test signals; IEEE ATML Test Station is used to describe the mapping onto the test resources; an XML document is written to describe the mapping to the test resource IVI drivers; and, an IEEE 1641 defined COM interface is used access these documents. By producing a test program that conforms to the IEEE 1641 defined interfaces, it is shown that the defined tests can be validated, translated to the test platform's native IVI and executed, all using the same source.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"278 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116840146","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-11-06DOI: 10.1109/AUTEST.2009.5314094
M. Granieri, R. W. Lowdermilk
This paper provides the reader with an overview of current Synthetic Instrumentation technology and a discussion of the probable future direction of this interesting and disruptive technology. The paper opens with a brief introduction and technical overview of Synthetic Instrumentation and then presents a discourse on the primary attributes of Synthetic Instrumentation. Having reviewed the basics of Synthetic Instrumentation technology, the paper then goes on to discuss the fundamental classes/types of Synthetic Instruments (SI), their associated attributes, and typical types of users associated with these SI classes. The authors then discuss how Synthetic Instrumentation fits in the current Test and Measurement (T&M) application continuum. The paper concludes with a discussion on the possible disruptive impact of this emerging technology on the Test and Measurement (T&M) marketplace and the key technologies that will have a future impact on the continuing evolution of Synthetic Instrumentation.
{"title":"Synthetic Instrumentation: The road ahead","authors":"M. Granieri, R. W. Lowdermilk","doi":"10.1109/AUTEST.2009.5314094","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314094","url":null,"abstract":"This paper provides the reader with an overview of current Synthetic Instrumentation technology and a discussion of the probable future direction of this interesting and disruptive technology. The paper opens with a brief introduction and technical overview of Synthetic Instrumentation and then presents a discourse on the primary attributes of Synthetic Instrumentation. Having reviewed the basics of Synthetic Instrumentation technology, the paper then goes on to discuss the fundamental classes/types of Synthetic Instruments (SI), their associated attributes, and typical types of users associated with these SI classes. The authors then discuss how Synthetic Instrumentation fits in the current Test and Measurement (T&M) application continuum. The paper concludes with a discussion on the possible disruptive impact of this emerging technology on the Test and Measurement (T&M) marketplace and the key technologies that will have a future impact on the continuing evolution of Synthetic Instrumentation.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"193 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132032734","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-11-06DOI: 10.1109/AUTEST.2009.5314041
J. Lagrotta, D. Lowenstein
In electronics today one thing stays constant, change. It seems that every day somebody is pushing the limits of what to expect next out of the phone we talk on, the computer we use to do our day job, the equipment our soldier are protecting us with. As electronic system technology becomes more complex, it becomes more difficult to assure customer satisfaction. Carefully planned instrumentation migration and modernization can maximize test-system efficiency, performance and quality—and provide meaningful cost savings. There are certainly risks associated with test program set (TPS) migration and modernization. The decision to forego modernization also carries a variety of risks. Ultimately, the decision to refresh outdated technology can provide meaningful cost reductions in areas such as the number of test sets, system throughput, and calibration, maintenance and repair. This paper will explore ways you can mitigate the risks of migration by applying proven success factors.
{"title":"To upgrade my ATE or not to upgrade","authors":"J. Lagrotta, D. Lowenstein","doi":"10.1109/AUTEST.2009.5314041","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314041","url":null,"abstract":"In electronics today one thing stays constant, change. It seems that every day somebody is pushing the limits of what to expect next out of the phone we talk on, the computer we use to do our day job, the equipment our soldier are protecting us with. As electronic system technology becomes more complex, it becomes more difficult to assure customer satisfaction. Carefully planned instrumentation migration and modernization can maximize test-system efficiency, performance and quality—and provide meaningful cost savings. There are certainly risks associated with test program set (TPS) migration and modernization. The decision to forego modernization also carries a variety of risks. Ultimately, the decision to refresh outdated technology can provide meaningful cost reductions in areas such as the number of test sets, system throughput, and calibration, maintenance and repair. This paper will explore ways you can mitigate the risks of migration by applying proven success factors.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"26 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134319846","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-11-06DOI: 10.1109/AUTEST.2009.5314060
Philip Ridl
Ethernet is an emerging communication technology in the avionics industry. There are many advantages to utilizing ethernet that include a very high data rate, some noise immunity, weight savings, and commercially available equipment. Some of the disadvantages include extra line replaceable units (LRUs) on the plane (ethernet switches) and added difficulties in aircraft wiring. This new technology brings with it many challenges in an automated test equipment (ATE) environment including, signal distortion, connector repeatability, and expensive measurement equipment.
{"title":"Issues with ethernet parametric testing in a production enviroment","authors":"Philip Ridl","doi":"10.1109/AUTEST.2009.5314060","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314060","url":null,"abstract":"Ethernet is an emerging communication technology in the avionics industry. There are many advantages to utilizing ethernet that include a very high data rate, some noise immunity, weight savings, and commercially available equipment. Some of the disadvantages include extra line replaceable units (LRUs) on the plane (ethernet switches) and added difficulties in aircraft wiring. This new technology brings with it many challenges in an automated test equipment (ATE) environment including, signal distortion, connector repeatability, and expensive measurement equipment.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131006027","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2009-11-06DOI: 10.1109/AUTEST.2009.5314051
H. Al-Asaad
With transient and intermittent operational faults becoming a dominant failure mode in modern digital systems, the deployment of on-line test technology is becoming a major design objective. On-line periodic BIST is a testing method for the detection of operational faults in digital systems. The method applies a near-minimal deterministic test sequence periodically to the circuit under test and checks the circuit responses to detect the existence of operational faults. On-line periodic BIST is characterized by full error coverage, bounded error latency, moderate space and time redundancy. In this paper, we present various techniques to minimize the error latency without sacrificing the full error coverage. These techniques are primarily based on the reordering the test vectors or the selective repetition of test vectors. Our analytical and preliminary experimental results demonstrate that our techniques lead to a significant reduction in the error latency.
{"title":"Efficient techniques for reducing error latency in on-line periodic BIST","authors":"H. Al-Asaad","doi":"10.1109/AUTEST.2009.5314051","DOIUrl":"https://doi.org/10.1109/AUTEST.2009.5314051","url":null,"abstract":"With transient and intermittent operational faults becoming a dominant failure mode in modern digital systems, the deployment of on-line test technology is becoming a major design objective. On-line periodic BIST is a testing method for the detection of operational faults in digital systems. The method applies a near-minimal deterministic test sequence periodically to the circuit under test and checks the circuit responses to detect the existence of operational faults. On-line periodic BIST is characterized by full error coverage, bounded error latency, moderate space and time redundancy. In this paper, we present various techniques to minimize the error latency without sacrificing the full error coverage. These techniques are primarily based on the reordering the test vectors or the selective repetition of test vectors. Our analytical and preliminary experimental results demonstrate that our techniques lead to a significant reduction in the error latency.","PeriodicalId":187421,"journal":{"name":"2009 IEEE AUTOTESTCON","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131002293","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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