Threshold Switching in Amorphous Cr-Doped Vanadium Oxide for New Crossbar Selector

J. Rupp, R. Waser, D. Wouters
{"title":"Threshold Switching in Amorphous Cr-Doped Vanadium Oxide for New Crossbar Selector","authors":"J. Rupp, R. Waser, D. Wouters","doi":"10.1109/IMW.2016.7495293","DOIUrl":null,"url":null,"abstract":"Symmetrical (Pt) electroded undoped (Pt/a-VO<sub>x</sub>/Pt) and Cr-doped amorphous Vanadium Oxide (Pt/a-V<sub>1-y</sub>Cr<sub>y</sub>O<sub>x</sub>/Pt) devices were fabricated and electrically analyzed. Both devices show reproducible and symmetrical threshold switching after an initial forming step. However, the kind of threshold switching was basically different. For the undoped VO<sub>x</sub>, threshold switching was identified as a low T<sub>C</sub>, VO<sub>2</sub>-type IMT, consistent with disappearance of the switching around 60 °C, whereas Cr-doped VO<sub>x</sub> switches up to > 90 °C, with a lower OFF-state current. These properties together with the poor conduction in the initial amorphous films make this new Cr-doped amorphous VO<sub>x</sub> material of high interest for selector material in both 2D 1S1R and a newly proposed 3D selector scheme.","PeriodicalId":365759,"journal":{"name":"2016 IEEE 8th International Memory Workshop (IMW)","volume":"6 10","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-05-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"11","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE 8th International Memory Workshop (IMW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMW.2016.7495293","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 11

Abstract

Symmetrical (Pt) electroded undoped (Pt/a-VOx/Pt) and Cr-doped amorphous Vanadium Oxide (Pt/a-V1-yCryOx/Pt) devices were fabricated and electrically analyzed. Both devices show reproducible and symmetrical threshold switching after an initial forming step. However, the kind of threshold switching was basically different. For the undoped VOx, threshold switching was identified as a low TC, VO2-type IMT, consistent with disappearance of the switching around 60 °C, whereas Cr-doped VOx switches up to > 90 °C, with a lower OFF-state current. These properties together with the poor conduction in the initial amorphous films make this new Cr-doped amorphous VOx material of high interest for selector material in both 2D 1S1R and a newly proposed 3D selector scheme.
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新型横杆选择器中非晶态掺cr氧化钒的阈值开关
制备了对称(Pt)电极未掺杂(Pt/a-VOx/Pt)和cr掺杂的非晶态氧化钒(Pt/a-V1-yCryOx/Pt)器件并进行了电分析。在初始成形步骤后,两种器件都显示出可重复和对称的阈值开关。然而,阈值转换的类型基本上是不同的。对于未掺杂的VOx,阈值开关被确定为低TC, vo2型IMT,与开关在60°C左右消失一致,而cr掺杂的VOx开关高达> 90°C,具有较低的off状态电流。这些特性加上初始非晶膜的导电性差,使得这种新的掺铬非晶VOx材料成为2D 1S1R和新提出的3D选择方案中选择材料的高度兴趣。
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