{"title":"Simulation of writing head in perpendicular magnetic recording system","authors":"Young-hun Im, Eun-Sik Kim, Yong-su Kim, G. Park","doi":"10.1109/ISIE.2001.932039","DOIUrl":null,"url":null,"abstract":"For perpendicular magnetic recording system, we suggest the modeling scheme combining finite element method and the fine field analysis. We did not use the Karlqvist head field but simulated a head field by the finite element method with precise simulation. For this purpose, we developed a Laplace program to calculate the head field at micromagnetic domains. We simulated the write process for a conventional head with a single layer perpendicular media and compared magnetic force microscopy images of simulated written bit patterns and tested patterns.","PeriodicalId":124749,"journal":{"name":"ISIE 2001. 2001 IEEE International Symposium on Industrial Electronics Proceedings (Cat. No.01TH8570)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ISIE 2001. 2001 IEEE International Symposium on Industrial Electronics Proceedings (Cat. No.01TH8570)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISIE.2001.932039","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
For perpendicular magnetic recording system, we suggest the modeling scheme combining finite element method and the fine field analysis. We did not use the Karlqvist head field but simulated a head field by the finite element method with precise simulation. For this purpose, we developed a Laplace program to calculate the head field at micromagnetic domains. We simulated the write process for a conventional head with a single layer perpendicular media and compared magnetic force microscopy images of simulated written bit patterns and tested patterns.
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