{"title":"How to Exploit Prior Knowledge in Industrial 3D-Metrology","authors":"C. Faber, M. Strohmeier, Hanning Liang","doi":"10.1364/COSI.2019.CTH2A.6","DOIUrl":null,"url":null,"abstract":"The goal of every measurement is to obtain new information about the specimen - preferably with as little effort as possible. We will discuss different ways of exploiting prior knowledge to accomplish this goal in industrial environments.","PeriodicalId":123636,"journal":{"name":"Imaging and Applied Optics 2019 (COSI, IS, MATH, pcAOP)","volume":"80 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Imaging and Applied Optics 2019 (COSI, IS, MATH, pcAOP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/COSI.2019.CTH2A.6","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The goal of every measurement is to obtain new information about the specimen - preferably with as little effort as possible. We will discuss different ways of exploiting prior knowledge to accomplish this goal in industrial environments.
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