Kaori Kikuchi, B. Lamond, A. Ghosh, P. Peers, P. Debevec
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引用次数: 1
Abstract
We present a prototype system for in-situ measurement of per-pixel appearance parameters (i.e., surface orientation, diffuse albedo, specular albedo, and specular roughness) of general scenes. The proposed system requires no specialized hardware, is light weight, and requires no on-site calibration. This makes our system particularly well suited for capturing the appearance of real-world scenes under uncontrolled conditions.
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