{"title":"Advanced soft-error-rate (SER) estimation with striking-time and multi-cycle effects","authors":"Ryan H.-M. Huang, Charles H.-P. Wen","doi":"10.1145/2593069.2593081","DOIUrl":null,"url":null,"abstract":"Soft error rate (SER) has become a critical reliability issue for CMOS designs due to continuous technology scaling. However, the striking-time and multi-cycle effects have not been properly considered in SER for advanced CMOS designs. Therefore, in this paper, the striking-time and multi-cycle effects are formulated into the problem of SER estimation, and then a SER analysis framework is proposed, accordingly. Experimental results show that SERs on the benchmark circuits are seriously underestimated when ignoring both effects. Moreover, SERs increase more on those high-performance or low-power CMOS designs. New treatment to SER needs to be explored in the future.","PeriodicalId":433816,"journal":{"name":"2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/2593069.2593081","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
Soft error rate (SER) has become a critical reliability issue for CMOS designs due to continuous technology scaling. However, the striking-time and multi-cycle effects have not been properly considered in SER for advanced CMOS designs. Therefore, in this paper, the striking-time and multi-cycle effects are formulated into the problem of SER estimation, and then a SER analysis framework is proposed, accordingly. Experimental results show that SERs on the benchmark circuits are seriously underestimated when ignoring both effects. Moreover, SERs increase more on those high-performance or low-power CMOS designs. New treatment to SER needs to be explored in the future.
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