{"title":"Experimental Results of Transition Fault Simulation with DC Scan Tests","authors":"Wataru Kawamura, Takeshi Onodera","doi":"10.1109/ATS.2007.50","DOIUrl":null,"url":null,"abstract":"The results indicate the effectiveness of the DC scan ATPG algorithm for transition fault detection in actual designs. Even though the at-speed toggle of the scan enable signal needs some DFT assistance such as pipelining, the classical DC scan ATPG algorithm seems worth considering for the first pass of AC scan ATPG runs.","PeriodicalId":289969,"journal":{"name":"16th Asian Test Symposium (ATS 2007)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"16th Asian Test Symposium (ATS 2007)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2007.50","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The results indicate the effectiveness of the DC scan ATPG algorithm for transition fault detection in actual designs. Even though the at-speed toggle of the scan enable signal needs some DFT assistance such as pipelining, the classical DC scan ATPG algorithm seems worth considering for the first pass of AC scan ATPG runs.