{"title":"Top 5 Issues in Practical Testing of High-Speed Interface Devices","authors":"T.J. Yamaguchi","doi":"10.1109/ATS.2007.122","DOIUrl":null,"url":null,"abstract":"Recently very different ways have been proposed to perform jitter testing of high-speed physical layer ICs in an HV production testing environment.","PeriodicalId":289969,"journal":{"name":"16th Asian Test Symposium (ATS 2007)","volume":"57 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"16th Asian Test Symposium (ATS 2007)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ATS.2007.122","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Recently very different ways have been proposed to perform jitter testing of high-speed physical layer ICs in an HV production testing environment.
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