{"title":"A New Methodology to Build the ICEM-CE Model for Microcontroller Units","authors":"Li Yuanhao, Xie Shuguo, Chen Yishu","doi":"10.1109/iwem53379.2021.9790696","DOIUrl":null,"url":null,"abstract":"In order to predict the conduction emission performance of a circuit board, manufacturers need to provide the electromagnetic compatibility (EMC) model of the chip to users. The Integrated circuit emission model-conducted emissions (ICEM-CE) modelling method proposed in standard IEC62433-2 can target various active chips, but lacks specificity for chips with typical characteristics of electromagnetic compatibility. In this paper, we propose a parametric model construction method for microcontroller units (MCUs). By studying the characteristics of the internal activity (IA) of the MCUs, the universal prior information for MCUs is obtained, and the parameterized model is constructed.","PeriodicalId":141204,"journal":{"name":"2021 IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition (iWEM)","volume":"55 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-11-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE International Workshop on Electromagnetics: Applications and Student Innovation Competition (iWEM)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/iwem53379.2021.9790696","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
In order to predict the conduction emission performance of a circuit board, manufacturers need to provide the electromagnetic compatibility (EMC) model of the chip to users. The Integrated circuit emission model-conducted emissions (ICEM-CE) modelling method proposed in standard IEC62433-2 can target various active chips, but lacks specificity for chips with typical characteristics of electromagnetic compatibility. In this paper, we propose a parametric model construction method for microcontroller units (MCUs). By studying the characteristics of the internal activity (IA) of the MCUs, the universal prior information for MCUs is obtained, and the parameterized model is constructed.
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