High Performance 3.3KV 4H-SiC MOSFET with a Floating Island and Hetero Junction Diode

Jaeyeop Na, Kwan-Su Kim
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Abstract

In this paper, a 3.3 kV 4H-SiC MOSFET structure with a floating island and a built-in heterojunction diode (FIHJD-MOSFET) is proposed, and analyzed by TCAD simulator. The floating island in the FIHJD-MOSFET not only improves the static performance of the device through charge balancing but also protects the P+ polysilicon region from a high electric field. Owing to this, the FIHJD-MOSFET operates stably even at high voltage, and the reverse recovery charge and the switching loss are also improved through the built-in heterojunction diode. As a result, B-FOM of FIHJD-MOSFET improved by 67.4 %, and reverse recovery charge and total switching loss were improved by 72.7 % and 66.4 % respectively, compared to conventional diffusion MOSFET (C-DMOSFET).
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具有浮岛和异质结二极管的高性能3.3KV 4H-SiC MOSFET
本文提出了一种3.3 kV浮岛内置异质结二极管的4H-SiC MOSFET结构(FIHJD-MOSFET),并通过TCAD模拟器进行了分析。FIHJD-MOSFET中的浮岛不仅通过电荷平衡提高了器件的静态性能,而且还保护了P+多晶硅区域免受高电场的影响。因此,即使在高压下,FIHJD-MOSFET也可以稳定地工作,并且通过内置异质结二极管也可以提高反向恢复电荷和开关损耗。结果表明,与传统扩散MOSFET (C-DMOSFET)相比,FIHJD-MOSFET的B-FOM提高了67.4%,反向恢复电荷和总开关损耗分别提高了72.7%和66.4%。
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