{"title":"Reliability & failure analysis methodology of optoelectronics and its extendibility for future technologies","authors":"Jia-Sheng Huang","doi":"10.1109/AVFOP.2010.5637671","DOIUrl":null,"url":null,"abstract":"We review the state-of-the-art reliability and failure analysis methodology of the optoelectronic devices. We will discuss the feasibility and extendibility of applying those established techniques to the future technologies such as nanotechnologies and renewable energies.","PeriodicalId":281705,"journal":{"name":"2010 Avionics, Fiber-Optics and Photonics Technology Conference","volume":"61 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-11-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 Avionics, Fiber-Optics and Photonics Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/AVFOP.2010.5637671","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
We review the state-of-the-art reliability and failure analysis methodology of the optoelectronic devices. We will discuss the feasibility and extendibility of applying those established techniques to the future technologies such as nanotechnologies and renewable energies.
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