{"title":"An enhanced analytical electrical masking model for multiple event transients","authors":"Adam Watkins, S. Tragoudas","doi":"10.1145/2902961.2903007","DOIUrl":null,"url":null,"abstract":"Due to the reducing transistor feature size, the susceptibility of modern circuits to radiation induced errors has increased. This, as a result, has increased the likelihood of multiple transients affecting a circuit. An important aspect when modeling convergent pulses is the approximation of the gate output. Thus, in this paper, a model that approximates the output pulse shape for convergent inputs is proposed. Extensive simulations showed that the proposed model matched closely with HSPICE and provides a speed-up of 15X.","PeriodicalId":407054,"journal":{"name":"2016 International Great Lakes Symposium on VLSI (GLSVLSI)","volume":"112 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 International Great Lakes Symposium on VLSI (GLSVLSI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/2902961.2903007","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
Due to the reducing transistor feature size, the susceptibility of modern circuits to radiation induced errors has increased. This, as a result, has increased the likelihood of multiple transients affecting a circuit. An important aspect when modeling convergent pulses is the approximation of the gate output. Thus, in this paper, a model that approximates the output pulse shape for convergent inputs is proposed. Extensive simulations showed that the proposed model matched closely with HSPICE and provides a speed-up of 15X.
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