Mazinov Alim Seit-Ametovich, Tyutyunik Andrey Sergeevich, Gurchenko Vladimir Sergeevich, Fitaev Ibraim Shevchetovich, V. V. Maksimovich
{"title":"Absorbing and Conductive Properties of Thin Fullerene and Aluminum Films","authors":"Mazinov Alim Seit-Ametovich, Tyutyunik Andrey Sergeevich, Gurchenko Vladimir Sergeevich, Fitaev Ibraim Shevchetovich, V. V. Maksimovich","doi":"10.1109/APEDE48864.2020.9255600","DOIUrl":null,"url":null,"abstract":"This article presents the comparative characteristics of the transmission and reflection spectra of electromagnetic radiation of thin carbon and metal films in the frequency range 8.2-12.0 GHz. The distinctive features of each of the methods for producing the studied fullerene and aluminum thin films are shown. The analysis of profilograms and the general 3D topology of the surface of the obtained films by atomic force microscopy is carried out. A comparative analysis of the interaction of microwave electromagnetic radiation with the materials under study is given. Additionally, the conductive properties of the obtained thin films are presented and described.","PeriodicalId":277559,"journal":{"name":"2020 International Conference on Actual Problems of Electron Devices Engineering (APEDE)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-09-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 International Conference on Actual Problems of Electron Devices Engineering (APEDE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/APEDE48864.2020.9255600","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
This article presents the comparative characteristics of the transmission and reflection spectra of electromagnetic radiation of thin carbon and metal films in the frequency range 8.2-12.0 GHz. The distinctive features of each of the methods for producing the studied fullerene and aluminum thin films are shown. The analysis of profilograms and the general 3D topology of the surface of the obtained films by atomic force microscopy is carried out. A comparative analysis of the interaction of microwave electromagnetic radiation with the materials under study is given. Additionally, the conductive properties of the obtained thin films are presented and described.
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