D. Siebenkotten, M. Marschall, G. Wübbeler, A. Hoehl, E. Rühl, C. Elster, B. Kästner
{"title":"Realization of subsampling schemes for compressive nano-FTIR imaging","authors":"D. Siebenkotten, M. Marschall, G. Wübbeler, A. Hoehl, E. Rühl, C. Elster, B. Kästner","doi":"10.1117/12.2672558","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":129649,"journal":{"name":"Modeling Aspects in Optical Metrology IX","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-08-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Modeling Aspects in Optical Metrology IX","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2672558","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
