Toward a unified framework for static and dynamic measurements

Abstract

A general probabilistic model of the measurement process is discussed, showing how it can address both static and dynamic measurements. Emphasis is placed on the latter and two main kinds of dynamic measurements are considered: direct, where the goal is to monitor a phenomenon over time, and indirect, where an alternative representation is sought, such as, typically, the spectrum. It is shown that both cases can be treated in the same framework, through a proper interpretation of the variables involved. Guidelines for the application of this approach are also provided.