{"title":"Power distribution analysis methodology for a multi-gigabit I/O interface","authors":"R. Schmitt, X. Huang, C. Yuan","doi":"10.1109/EPEP.2003.1250018","DOIUrl":null,"url":null,"abstract":"As the operating frequency of I/O circuits increases and voltage swing decreases, it becomes increasingly important to verify the power distribution network (PDN). This paper presents a methodology used to design and verify the PDN for a multi-gigabit memory interfaces. It describes the modeling of PDN components, the necessary analysis steps to assist in the design of a high-quality PDN, and the simulations to predict the impact of supply noise on the signal quality in the memory channel.","PeriodicalId":254477,"journal":{"name":"Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710)","volume":"94 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-12-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Performance of Electrical Packaging (IEEE Cat. No. 03TH8710)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.2003.1250018","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
As the operating frequency of I/O circuits increases and voltage swing decreases, it becomes increasingly important to verify the power distribution network (PDN). This paper presents a methodology used to design and verify the PDN for a multi-gigabit memory interfaces. It describes the modeling of PDN components, the necessary analysis steps to assist in the design of a high-quality PDN, and the simulations to predict the impact of supply noise on the signal quality in the memory channel.
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