{"title":"Structural solution of reconfiguration based built-in self-test for analog and mixed-signal IC","authors":"S. Mosin","doi":"10.1109/BEC.2010.5630220","DOIUrl":null,"url":null,"abstract":"The structural solution of built-in self test for analog and mixed-signal IC based on reconfiguring original circuit in oscillator has been proposed. The principles of functioning and main components of the solution have been considered. The experimental results for active filter have been shown.","PeriodicalId":228594,"journal":{"name":"2010 12th Biennial Baltic Electronics Conference","volume":"98 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2010 12th Biennial Baltic Electronics Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/BEC.2010.5630220","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The structural solution of built-in self test for analog and mixed-signal IC based on reconfiguring original circuit in oscillator has been proposed. The principles of functioning and main components of the solution have been considered. The experimental results for active filter have been shown.
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