An accurate measurement method for optical radiation loss of silicon-on-insulator curved waveguides

Abstract

Silicon-on-insulator (SOI) photonic integrated circuits have recently become a research topic of great interest due to their compact confinements and compatibility with the modern micro-electronics. Low-loss SOI curved waveguides are attracting attention as they offer solutions to the dominant issue of integration density of planar lightwave circuits on a single SOI chip. Propagation loss and radiation loss rate of SOI curved waveguides are accurately measured by using Fabry-Perot interferometric method with the help of an optical vector analyzer (Luna system). The presented technique provides a universal solution for optical loss measurement of photonic integrated chips.